Power Semiconductor Test Systems

The Static Parameter Power Semiconductor Test System is built for high-speed and
precise testing of medium to high-power semiconductor components, such as diodes, MOSFETs, and IGBTs, across a wide voltage range.
Designed by VX Instruments, this system supports a comprehensive suite of static parameter tests and includes a modular PXI platform with an open interface,
allowing for additional testing options, including DUT-specific resistor networks and temperature sensors.

– Output voltage up to 3000V
– Output current up to 2400A
– Pulse length down to 100 μs
– Accuracy down to pA-resolution- Output voltage up to 3000V
– Output current up to 2400A
– Pulse length down to 100 μs
– Accuracy down to pA-resolution
– High-speed instrument interfacing
– Very low noise levels due to isolated measurement technology
– Zero-leakage current technology

Test System Main Components:

High Current SMU

– Extremely low noise with linear output stage
– Output current up to 1.200 A pulse mode
– Programmable output voltage up to 50 V

Multi Channel SMU

– Extreme low noise with linear output stage
– Fully isolated design, isolated input and outputs
– Fast measurement of current in nA range

High Voltage SMU

– Extreme low noise with linear output stage
– Output voltage from -500 V up to 2500 V
– Very fast rise and fall times
– Output current in pulse mode max ±30 mA
– Output current in continuous mode max ±8 mA

Switching Matrix

– Up to 24 IBGT/MOSFETs per DUT
– High Current design up to 2400 A
– High Voltage design up to 3000 V

Laser Diode Test System

Freely Prgrammable
– Short pulses from 2µs
– Pulse Current upto 250 mA
– Support for 2 photo sensors

 

Signal Generators

Digital Multimeters, Oscilloscopes, Digitizers, Generators & Digital I/O’s
– 500Vpp
– Isolated
– DMM
– Digitizer
– Trigger

PXIe Chassis

Save Space in your Racks
– 6 Slot (1u) or 12 Slot (2u) Systems